A practical approach for electromagnetic analysis with the effect of the residual strain due to manufacturing processes

Hiroyuki Sano, Katsuyuki Narita, Eri Zeze, Takashi Yamada, Ueta Kazuki, Kan Akatsu

研究成果: Conference contribution

6 引用 (Scopus)

抜粋

Toward reliable and advanced machine designs, a practical modeling method of degraded steel sheets due to manufacturing processes is proposed. The advantage of the proposed method is the fact that the required material data can be measured with the standard single sheet testing without special measurement equipment so that machine manufactures will be able to take into account of the degradation effects according to their manufacturing processes. In the proposed approach, an approximation function which represents spatial variation of the degradation for each BH and loss property is identified using measurement data of steel sheet strips which have different widths. The identified approximation functions provide the material properties for Finite Element Analysis. It is shown that FEA calculations using the proposed method reproduce well the measurement results of cut steel sheets.

元の言語English
ホスト出版物のタイトルECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
出版者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781509007370
DOI
出版物ステータスPublished - 2017 2 13
イベント2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016 - Milwaukee, United States
継続期間: 2016 9 182016 9 22

Other

Other2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016
United States
Milwaukee
期間16/9/1816/9/22

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Energy Engineering and Power Technology
  • Control and Optimization

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  • これを引用

    Sano, H., Narita, K., Zeze, E., Yamada, T., Kazuki, U., & Akatsu, K. (2017). A practical approach for electromagnetic analysis with the effect of the residual strain due to manufacturing processes. : ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings [7854757] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ECCE.2016.7854757