A Thermal Measurement System for Nano-meter Scale Area Evaluation

Kastuhiro Tanaka, Sumito Nagasawa, Takahito Ono, Hiroki Kuwano

研究成果: Article › 査読

本文言語	English
ページ（範囲）	337
ジャーナル	Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)
出版ステータス	Published - 2006 4月 1

引用スタイル

@article{76e13b0e804244d198b5c0a0ccfb3b19,

title = "A Thermal Measurement System for Nano-meter Scale Area Evaluation",

author = "Kastuhiro Tanaka and Sumito Nagasawa and Takahito Ono and Hiroki Kuwano",

year = "2006",

month = apr,

day = "1",

language = "English",

pages = "337",

journal = "Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)",

}

TY - JOUR

T1 - A Thermal Measurement System for Nano-meter Scale Area Evaluation

AU - Tanaka, Kastuhiro

AU - Nagasawa, Sumito

AU - Ono, Takahito

AU - Kuwano, Hiroki

PY - 2006/4/1

Y1 - 2006/4/1

M3 - Article

SP - 337

JO - Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)

JF - Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)

ER -