| 元の言語 | English |
|---|---|
| ジャーナル | Default journal |
| 出版物ステータス | Published - 2011 9 18 |
これを引用
Nellist, P. D., Kirkl, P. D. NP. WA. I., & Shimojo, . A. J. DAA. J. ML. J. AA. HM. T. (2011). Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials. Default journal.
Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials. / Nellist, P. D.; Kirkl, P. D.Nellist;P.Wang;A.I.; Shimojo, ; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T.
：: Default journal, 18.09.2011.研究成果: Article
Nellist, PD, Kirkl, PDNPWAI & Shimojo, AJDAAJMLJAAHMT 2011, 'Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials', Default journal.
Nellist PD, Kirkl PDNPWAI, Shimojo AJDAAJMLJAAHMT. Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials. Default journal. 2011 9 18.
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