Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T Shimojo

研究成果: Article

元の言語English
ジャーナルDefault journal
出版物ステータスPublished - 2011 9 18

これを引用

@article{e6557931558245379527d43c254a9e0d,
title = "Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials",
author = "Nellist, {P. D.} and Kirkl, {P. D.Nellist;P.Wang;A.I.} and Shimojo, {; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T}",
year = "2011",
month = "9",
day = "18",
language = "English",
journal = "Default journal",

}

TY - JOUR

T1 - Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials

AU - Nellist, P. D.

AU - Kirkl, P. D.Nellist;P.Wang;A.I.

AU - Shimojo, ; A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.T

PY - 2011/9/18

Y1 - 2011/9/18

M3 - Article

JO - Default journal

JF - Default journal

ER -