Nd-Ba-Cu-O sample fabricated by the oxygen-controlled-melt-growth method exhibits large Jc values in a high field region and also shows a secondary peak effect. In the present study, the Nd-Ba-Cu-O sample was characterized by using the flux profile technique, in which the χ′ signal is plotted against the amplitude of AC field. Jc values determined with the flux profile technique also showed a clear secondary peak effect. In addition, such Jc values were higher than those measured with DC susceptibility, presumably due to a difference in the electric field to determine Jc.
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