抄録
Surface magic clusters (SMCs) of In on Si(111)-7 × 7 surfaces and adhesion of subsequently deposited Ag atoms to them, were observed and analyzed by scanning tunneling microscopy (STM), transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). Formation of In SMCs on faulted halves of 7 × 7 unit cells was confirmed by both STM images and transmission diffraction patterns. By subsequent Ag deposition, adhesion of Ag atoms onto preexisting In SMCs was observed. Corresponding diffraction pattern suggests that Ag atoms captured in the In SMCs have characteristic atomic structure which is different from known Ag-In alloy phase. The changes in EELS spectrum are also discussed.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 1520-1523 |
| ページ数 | 4 |
| ジャーナル | Surface and Interface Analysis |
| 巻 | 42 |
| 号 | 10-11 |
| DOI | |
| 出版ステータス | Published - 2010 10月 1 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 化学 (全般)
- 凝縮系物理学
- 表面および界面
- 表面、皮膜および薄膜
- 材料化学