TY - CHAP
T1 - Advanced characterization of multiferroic materials by scanning probe methods and scanning electron microscopy
AU - Koblischka, Michael R.
AU - Koblischka-Veneva, Anjela
N1 - Publisher Copyright:
© 2016 John Wiley & Sons, Ltd.
PY - 2016/1/1
Y1 - 2016/1/1
N2 - The scanning probe techniques (SPM) are the most important research tool for nanoscience and nanostructured materials. Among the various methods developed in the literature, scanning force microscopy (SFM) and scanning tunneling microscopy (STM) are the most representative. The SPM techniques measure in parallel the topography and the physical quantity, as the topography may interact with the desired information. An example of such a technique is magnetic force microscopy (MFM), where in two subsequent scans a topographic signal and a magnetic signal are detected. This principle is employed also in similar techniques like electric field microscopy (EFM) or piezoforce microscopy (PFM). AFM/MFM techniques offer a resolution in the range 1-40 nm, which is therefore an ideal combination with the electron backscatter diffraction (EBSD) technique. This type of combined measurement can even be further enhanced by a detailed knowledge about the sample properties like crystallographic orientation, texture, grain boundaries and misorientation angles.
AB - The scanning probe techniques (SPM) are the most important research tool for nanoscience and nanostructured materials. Among the various methods developed in the literature, scanning force microscopy (SFM) and scanning tunneling microscopy (STM) are the most representative. The SPM techniques measure in parallel the topography and the physical quantity, as the topography may interact with the desired information. An example of such a technique is magnetic force microscopy (MFM), where in two subsequent scans a topographic signal and a magnetic signal are detected. This principle is employed also in similar techniques like electric field microscopy (EFM) or piezoforce microscopy (PFM). AFM/MFM techniques offer a resolution in the range 1-40 nm, which is therefore an ideal combination with the electron backscatter diffraction (EBSD) technique. This type of combined measurement can even be further enhanced by a detailed knowledge about the sample properties like crystallographic orientation, texture, grain boundaries and misorientation angles.
KW - Crystallographic orientation
KW - Electric field microscopy
KW - Electron backscatter diffraction technique
KW - Magnetic force microscopy
KW - Multiferroic materials
KW - Nanotechnology
KW - Piezoforce microscopy
KW - Scanning force microscopy
KW - Scanning probe techniques
KW - Scanning tunneling microscopy
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U2 - 10.1002/9781118935743.ch12
DO - 10.1002/9781118935743.ch12
M3 - Chapter
AN - SCOPUS:85068879912
SN - 9781118935750
SP - 400
EP - 434
BT - Nanoscale Ferroelectrics and Multiferroics
PB - wiley
ER -