Advanced characterization of multiferroic materials by scanning probe methods and scanning electron microscopy

Michael R. Koblischka, Anjela Koblischka-Veneva

研究成果: Chapter

1 被引用数 (Scopus)

抄録

The scanning probe techniques (SPM) are the most important research tool for nanoscience and nanostructured materials. Among the various methods developed in the literature, scanning force microscopy (SFM) and scanning tunneling microscopy (STM) are the most representative. The SPM techniques measure in parallel the topography and the physical quantity, as the topography may interact with the desired information. An example of such a technique is magnetic force microscopy (MFM), where in two subsequent scans a topographic signal and a magnetic signal are detected. This principle is employed also in similar techniques like electric field microscopy (EFM) or piezoforce microscopy (PFM). AFM/MFM techniques offer a resolution in the range 1-40 nm, which is therefore an ideal combination with the electron backscatter diffraction (EBSD) technique. This type of combined measurement can even be further enhanced by a detailed knowledge about the sample properties like crystallographic orientation, texture, grain boundaries and misorientation angles.

本文言語English
ホスト出版物のタイトルNanoscale Ferroelectrics and Multiferroics
ホスト出版物のサブタイトルKey Processing and Characterization Issues, and Nanoscale Effects, 2 Volumes
出版社wiley
ページ400-434
ページ数35
ISBN(電子版)9781118935743
ISBN(印刷版)9781118935750
DOI
出版ステータスPublished - 2016 1月 1
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)

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