Advanced characterization of multiferroic materials by scanning probe methods and scanning electron microscopy

Engineering & Materials Science

• Magnetic force microscopy 100%
• Multiferroics 93%
• Topography 58%
• Microscopic examination 56%
• Scanning tunneling microscopy 46%
• Characterization (materials science) 45%
• Nanoscience 43%
• Scanning electron microscopy 41%
• Scanning 40%
• Electron diffraction 34%
• Atomic force microscopy 33%
• Nanostructured materials 32%
• Grain boundaries 26%
• Electric fields 24%
• Textures 20%