Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

Henri Kivistö; Mikko Rossi; Pete Jones; Rattanaporn Norarat; Nitipon Puttaraksa; Timo Sajavaara; Mikko Laitinen; Väinö Hänninen; Kimmo Ranttila; Pauli Heikkinen; Leona Gilbert; Varpu Marjomäki; Harry J. Whitlow

doi:10.1016/j.mee.2012.02.011

Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

Henri Kivistö, Mikko Rossi, Pete Jones, Rattanaporn Norarat, Nitipon Puttaraksa, Timo Sajavaara, Mikko Laitinen, Väinö Hänninen, Kimmo Ranttila, Pauli Heikkinen, Leona Gilbert, Varpu Marjomäki, Harry J. Whitlow

研究成果: Article › 査読

2 被引用数 (Scopus)

抄録

Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s ^-1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

本文言語	English
ページ（範囲）	9-11
ページ数	3
ジャーナル	Microelectronic Engineering
巻	102
DOI	https://doi.org/10.1016/j.mee.2012.02.011
出版ステータス	Published - 2013 2月
外部発表	はい

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
原子分子物理学および光学
凝縮系物理学
表面、皮膜および薄膜
電子工学および電気工学

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10.1016/j.mee.2012.02.011

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引用スタイル

Kivistö, H., Rossi, M., Jones, P., Norarat, R., Puttaraksa, N., Sajavaara, T., Laitinen, M., Hänninen, V., Ranttila, K., Heikkinen, P., Gilbert, L., Marjomäki, V., & Whitlow, H. J. (2013). Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing. Microelectronic Engineering, 102, 9-11. https://doi.org/10.1016/j.mee.2012.02.011

Kivistö, H, Rossi, M, Jones, P, Norarat, R, Puttaraksa, N, Sajavaara, T, Laitinen, M, Hänninen, V, Ranttila, K, Heikkinen, P, Gilbert, L, Marjomäki, V & Whitlow, HJ 2013, 'Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing', Microelectronic Engineering, vol. 102, pp. 9-11. https://doi.org/10.1016/j.mee.2012.02.011

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title = "Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing",

abstract = "Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.",

keywords = "Data acquisition, FPGA, Front-end, Microbeam, Time-stamping",

author = "Henri Kivist{\"o} and Mikko Rossi and Pete Jones and Rattanaporn Norarat and Nitipon Puttaraksa and Timo Sajavaara and Mikko Laitinen and V{\"a}in{\"o} H{\"a}nninen and Kimmo Ranttila and Pauli Heikkinen and Leona Gilbert and Varpu Marjom{\"a}ki and Whitlow, {Harry J.}",

note = "Funding Information: This work was supported the Academy of Finland, Centre of Excellence in Nuclear and Accelerator Based Physics , Ref. 213503 and Grant No. 129999 .",

year = "2013",

month = feb,

doi = "10.1016/j.mee.2012.02.011",

language = "English",

volume = "102",

pages = "9--11",

journal = "Microelectronic Engineering",

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T1 - Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

AU - Kivistö, Henri

AU - Rossi, Mikko

AU - Jones, Pete

AU - Norarat, Rattanaporn

AU - Puttaraksa, Nitipon

AU - Sajavaara, Timo

AU - Laitinen, Mikko

AU - Hänninen, Väinö

AU - Ranttila, Kimmo

AU - Heikkinen, Pauli

AU - Gilbert, Leona

AU - Marjomäki, Varpu

AU - Whitlow, Harry J.

N1 - Funding Information: This work was supported the Academy of Finland, Centre of Excellence in Nuclear and Accelerator Based Physics , Ref. 213503 and Grant No. 129999 .

PY - 2013/2

Y1 - 2013/2

N2 - Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

AB - Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

KW - Data acquisition

KW - FPGA

KW - Front-end

KW - Microbeam

KW - Time-stamping

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U2 - 10.1016/j.mee.2012.02.011

DO - 10.1016/j.mee.2012.02.011

M3 - Article

AN - SCOPUS:84869096389

VL - 102

SP - 9

EP - 11

JO - Microelectronic Engineering

JF - Microelectronic Engineering

SN - 0167-9317

ER -

Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

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