抄録
Many ion-matter interactions exhibit sub-μs time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s -1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.
本文言語 | English |
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ページ(範囲) | 9-11 |
ページ数 | 3 |
ジャーナル | Microelectronic Engineering |
巻 | 102 |
DOI | |
出版ステータス | Published - 2013 2月 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 原子分子物理学および光学
- 凝縮系物理学
- 表面、皮膜および薄膜
- 電子工学および電気工学