Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, Y. Chen, V. G. Harris

研究成果: Article

3 引用 (Scopus)

抜粋

The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.

元の言語English
記事番号5257384
ページ(範囲)4219-4222
ページ数4
ジャーナルIEEE Transactions on Magnetics
45
発行部数10
DOI
出版物ステータスPublished - 2009 10 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

フィンガープリント Analysis of grain shape and orientation in BaFe<sub>12</sub>O <sub>19</sub>-ferrites using electron backscatter diffraction (EBSD)' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用