Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, Y. Chen, V. G. Harris

研究成果: Article査読

4 被引用数 (Scopus)

抄録

The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.

本文言語English
論文番号5257384
ページ(範囲)4219-4222
ページ数4
ジャーナルIEEE Transactions on Magnetics
45
10
DOI
出版ステータスPublished - 2009 10
外部発表はい

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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