抜粋
The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.
| 元の言語 | English |
|---|---|
| 記事番号 | 5257384 |
| ページ（範囲） | 4219-4222 |
| ページ数 | 4 |
| ジャーナル | IEEE Transactions on Magnetics |
| 巻 | 45 |
| 発行部数 | 10 |
| DOI | |
| 出版物ステータス | Published - 2009 10 1 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
フィンガープリント Analysis of grain shape and orientation in BaFe<sub>12</sub>O <sub>19</sub>-ferrites using electron backscatter diffraction (EBSD)' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。
これを引用
Koblischka-Veneva, A., Koblischka, M. R., Chen, Y., & Harris, V. G. (2009). Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD). IEEE Transactions on Magnetics, 45(10), 4219-4222. [5257384]. https://doi.org/10.1109/TMAG.2009.2022020