Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD)

A. Koblischka-Veneva; M. R. Koblischka; Y. Chen; V. G. Harris

doi:10.1109/TMAG.2009.2022020

Analysis of grain shape and orientation in BaFe₁₂O ₁₉-ferrites using electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, Y. Chen, V. G. Harris

研究成果: Article › 査読

4 被引用数 (Scopus)

抄録

The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.

本文言語	English
論文番号	5257384
ページ（範囲）	4219-4222
ページ数	4
ジャーナル	IEEE Transactions on Magnetics
巻	45
号	10
DOI	https://doi.org/10.1109/TMAG.2009.2022020
出版ステータス	Published - 2009 10
外部発表	はい

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

文献へのアクセス

10.1109/TMAG.2009.2022020

フィンガープリント「Analysis of grain shape and orientation in BaFe<sub>12</sub>O <sub>19</sub>-ferrites using electron backscatter diffraction (EBSD)」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル

@article{a7dd78aac4f5449f8298f54f157c839b,

title = "Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD)",

abstract = "The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.",

keywords = "Crystal growth, Electron backscatter diffraction, Electron microscopy, Ferrite, Position measurement",

author = "A. Koblischka-Veneva and Koblischka, {M. R.} and Y. Chen and Harris, {V. G.}",

note = "Funding Information: ACKNOWLEDGMENT This work was supported by DFG project Mu959/19, which is gratefully acknowledged.",

year = "2009",

month = oct,

doi = "10.1109/TMAG.2009.2022020",

language = "English",

volume = "45",

pages = "4219--4222",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10",

}

TY - JOUR

T1 - Analysis of grain shape and orientation in BaFe12O 19-ferrites using electron backscatter diffraction (EBSD)

AU - Koblischka-Veneva, A.

AU - Koblischka, M. R.

AU - Chen, Y.

AU - Harris, V. G.

N1 - Funding Information: ACKNOWLEDGMENT This work was supported by DFG project Mu959/19, which is gratefully acknowledged.

PY - 2009/10

Y1 - 2009/10

N2 - The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.

AB - The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.

KW - Crystal growth

KW - Electron backscatter diffraction

KW - Electron microscopy

KW - Ferrite

KW - Position measurement

UR - http://www.scopus.com/inward/record.url?scp=70350589427&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=70350589427&partnerID=8YFLogxK

U2 - 10.1109/TMAG.2009.2022020

DO - 10.1109/TMAG.2009.2022020

M3 - Article

AN - SCOPUS:70350589427

VL - 45

SP - 4219

EP - 4222

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 10

M1 - 5257384

ER -