抄録
The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.
本文言語 | English |
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論文番号 | 5257384 |
ページ(範囲) | 4219-4222 |
ページ数 | 4 |
ジャーナル | IEEE Transactions on Magnetics |
巻 | 45 |
号 | 10 |
DOI | |
出版ステータス | Published - 2009 10 |
外部発表 | はい |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering