Analysis of lags and current collapse in field-plate AlGaN/GaN HEMTs with deep acceptors in a buffer layer

Naohiro Noda, Ryouhei Tsurumaki, Kazushige Horio

研究成果: Article査読

6 被引用数 (Scopus)

抄録

We make 2-D transient simulations of field-plate AlGaN/GaN HEMTs with a semi-insulating buffer layer, where a deep acceptor above the midgap is considered. It is studied how the deep acceptor and the field plate affect lag phenomena and current collapse. It is shown that the drain lag and current collapse could be reduced by introducing a field plate, as in a case with a deep acceptor compensated by a deep donor in the buffer layer. This reduction occurs because electron trapping by the deep acceptors is weakened by the field plate. The dependence on insulator thickness under the field plate is also studied, suggesting that there is an optimum thickness of insulator to minimize the current collapse of AlGaN/GaN HEMTs.

本文言語English
ページ(範囲)341-344
ページ数4
ジャーナルPhysica Status Solidi (C) Current Topics in Solid State Physics
13
5-6
DOI
出版ステータスPublished - 2016 5月 1

ASJC Scopus subject areas

  • 凝縮系物理学

フィンガープリント

「Analysis of lags and current collapse in field-plate AlGaN/GaN HEMTs with deep acceptors in a buffer layer」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル