Anti-resonance peak frequency control by variable on-die capacitance

Wataru Ichimura, Sho Kiyoshige, Masahiro Terasaki, Ryota Kobayashi, Genki Kubo, Hiroki Otsuka, Toshio Sudo

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.

本文言語English
ホスト出版物のタイトルEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
出版社IEEE Computer Society
ページ171-174
ページ数4
ISBN(印刷版)9781479923151
DOI
出版ステータスPublished - 2013 1 1
イベント9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013 - Nara, Japan
継続期間: 2013 12 152013 12 18

出版物シリーズ

名前EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits

Conference

Conference9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013
国/地域Japan
CityNara
Period13/12/1513/12/18

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学

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