Anti-resonance peak frequency control by variable on-die capacitance

Wataru Ichimura, Sho Kiyoshige, Masahiro Terasaki, Ryota Kobayashi, Genki Kubo, Hiroki Otsuka, Toshio Sudo

研究成果: Conference contribution

2 引用 (Scopus)

抄録

Power integrity design has been becoming important in the advanced CMOS digital systems, because power supply noise induces logic instability and electromagnetic radiation. Especially, anti-resonance peaks in power distribution network (PDN) due to the chip-package interaction induce the unwanted power supply fluctuation, and result in large electromagnetic radiation. In this paper, power supply noises and total impedances of power distribution network (PDN) for the variable structure of on-die capacitances have been examined. In addition, power supply noise and total PDN impedance have been examined by changing the number of power supply terminals. As a result, it has been proved that anti-resonance peaks could be controlled by on-die capacitance and the number of power supply terminals. Simulated anti-resonance peak frequencies were well correlated with the peak frequency spectra of measured power supply noise.

元の言語English
ホスト出版物のタイトルEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
出版者IEEE Computer Society
ページ171-174
ページ数4
ISBN(印刷物)9781479923151
DOI
出版物ステータスPublished - 2013
イベント9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013 - Nara
継続期間: 2013 12 152013 12 18

Other

Other9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013
Nara
期間13/12/1513/12/18

Fingerprint

Electric power distribution
Capacitance
Electromagnetic waves
Electric power systems

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

これを引用

Ichimura, W., Kiyoshige, S., Terasaki, M., Kobayashi, R., Kubo, G., Otsuka, H., & Sudo, T. (2013). Anti-resonance peak frequency control by variable on-die capacitance. : EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 171-174). [6735195] IEEE Computer Society. https://doi.org/10.1109/EMCCompo.2013.6735195

Anti-resonance peak frequency control by variable on-die capacitance. / Ichimura, Wataru; Kiyoshige, Sho; Terasaki, Masahiro; Kobayashi, Ryota; Kubo, Genki; Otsuka, Hiroki; Sudo, Toshio.

EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. IEEE Computer Society, 2013. p. 171-174 6735195.

研究成果: Conference contribution

Ichimura, W, Kiyoshige, S, Terasaki, M, Kobayashi, R, Kubo, G, Otsuka, H & Sudo, T 2013, Anti-resonance peak frequency control by variable on-die capacitance. : EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits., 6735195, IEEE Computer Society, pp. 171-174, 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013, Nara, 13/12/15. https://doi.org/10.1109/EMCCompo.2013.6735195
Ichimura W, Kiyoshige S, Terasaki M, Kobayashi R, Kubo G, Otsuka H その他. Anti-resonance peak frequency control by variable on-die capacitance. : EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. IEEE Computer Society. 2013. p. 171-174. 6735195 https://doi.org/10.1109/EMCCompo.2013.6735195
Ichimura, Wataru ; Kiyoshige, Sho ; Terasaki, Masahiro ; Kobayashi, Ryota ; Kubo, Genki ; Otsuka, Hiroki ; Sudo, Toshio. / Anti-resonance peak frequency control by variable on-die capacitance. EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. IEEE Computer Society, 2013. pp. 171-174
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