Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D'Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo

研究成果: Article

1 引用 (Scopus)
元の言語English
ページ(範囲)376-377
ページ数2
ジャーナルMicroscopy and Microanalysis
20
発行部数3
DOI
出版物ステータスPublished - 2014 8 1

ASJC Scopus subject areas

  • Instrumentation

これを引用

Wang, P., Kirkland, A. I., Nellist, P. D., D'Alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2014). Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Microscopy and Microanalysis, 20(3), 376-377. https://doi.org/10.1017/S1431927614003602