Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D'Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo

研究成果: Article

1 引用 (Scopus)
元の言語English
ページ(範囲)376-377
ページ数2
ジャーナルMicroscopy and Microanalysis
20
発行部数3
DOI
出版物ステータスPublished - 2014 8 1

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Confocal microscopy
Aberrations
Electron microscopy
aberration
Electron microscopes
electron microscopes
Scanning
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

これを引用

Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. / Wang, Peng; Kirkland, Angus I.; Nellist, Peter D.; D'Alfonso, Adrian J.; Morgan, Andrew J.; Allen, Leslie J.; Hashimoto, Ayako; Takeguchi, Masaki; Mitsuishi, Kazutaka; Shimojo, Masayuki.

:: Microscopy and Microanalysis, 巻 20, 番号 3, 01.08.2014, p. 376-377.

研究成果: Article

Wang, P, Kirkland, AI, Nellist, PD, D'Alfonso, AJ, Morgan, AJ, Allen, LJ, Hashimoto, A, Takeguchi, M, Mitsuishi, K & Shimojo, M 2014, 'Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope', Microscopy and Microanalysis, 巻. 20, 番号 3, pp. 376-377. https://doi.org/10.1017/S1431927614003602
Wang, Peng ; Kirkland, Angus I. ; Nellist, Peter D. ; D'Alfonso, Adrian J. ; Morgan, Andrew J. ; Allen, Leslie J. ; Hashimoto, Ayako ; Takeguchi, Masaki ; Mitsuishi, Kazutaka ; Shimojo, Masayuki. / Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. :: Microscopy and Microanalysis. 2014 ; 巻 20, 番号 3. pp. 376-377.
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