Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D'Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo

研究成果: Conference article査読

1 被引用数 (Scopus)
本文言語English
ページ(範囲)376-377
ページ数2
ジャーナルMicroscopy and Microanalysis
20
3
DOI
出版ステータスPublished - 2014 8 1
イベントMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
継続期間: 2014 8 32014 8 7

ASJC Scopus subject areas

  • Instrumentation

引用スタイル