Characteristics of Al 2 O 3 /native oxide/n-GaN capacitors by post-metallization annealing
Kazuya Yuge, Toshihide Nabatame, Yoshihiro Irokawa, Akihiko Ohi, Naoki Ikeda, Liwen Sang, Yasuo Koide, Tomoji Ohishi
研究成果 › 査読
18
被引用数
(Scopus)