Characterization of bulk superconductors through EBSD methods

研究成果: Conference article

21 引用 (Scopus)

抄録

The application of electron backscatter diffraction (EBSD) technique to bulk high-Tc superconductors is presented and reviewed. Due to the ceramic nature and the complex crystallographic unit cells of the perovskite-type high-Tc superconductors, the EBSD analysis is not yet as common as it deserves. We have successfully performed EBSD analysis on a variety of high-Tc compounds and samples including polycrystalline YBCO (pure and doped by alkali metals), melt-textured YBCO, thin and thick films of YBCO; the "green phase" Y2BaCuO5, thin film and melt-textured NdBa2Cu3Ox and Bi-2212 single crystals and tapes. It is shown that the surface preparation of the samples is crucial due to the small information depth (up to 100 nm) of the EBSD technique. High quality Kikuchi patterns are the requirement in order to enable the automated EBSD mapping, which yields phase distributions, individual grain orientations and the misorientation angle distribution. The results can be presented in form of mappings, as charts, and as pole figures. These informations are required for a better understanding of the growth mechanism(s) of bulk high-Tc superconductors intended for applications.

元の言語English
ページ(範囲)545-556
ページ数12
ジャーナルPhysica C: Superconductivity and its Applications
392-396
発行部数PART 1
DOI
出版物ステータスPublished - 2003 10 1
外部発表Yes
イベントProceedings of the 15th International Symposium on Superconduc - Yokohama, Japan
継続期間: 2002 11 112002 11 13

Fingerprint

Electron diffraction
Superconducting materials
diffraction
electrons
Alkali Metals
Thin films
Alkali metals
charts
thin films
Thick films
misalignment
Perovskite
Tapes
alkali metals
tapes
thick films
Poles
poles
Single crystals
ceramics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

これを引用

@article{983533381cab4f10a678dbe6e120735c,
title = "Characterization of bulk superconductors through EBSD methods",
abstract = "The application of electron backscatter diffraction (EBSD) technique to bulk high-Tc superconductors is presented and reviewed. Due to the ceramic nature and the complex crystallographic unit cells of the perovskite-type high-Tc superconductors, the EBSD analysis is not yet as common as it deserves. We have successfully performed EBSD analysis on a variety of high-Tc compounds and samples including polycrystalline YBCO (pure and doped by alkali metals), melt-textured YBCO, thin and thick films of YBCO; the {"}green phase{"} Y2BaCuO5, thin film and melt-textured NdBa2Cu3Ox and Bi-2212 single crystals and tapes. It is shown that the surface preparation of the samples is crucial due to the small information depth (up to 100 nm) of the EBSD technique. High quality Kikuchi patterns are the requirement in order to enable the automated EBSD mapping, which yields phase distributions, individual grain orientations and the misorientation angle distribution. The results can be presented in form of mappings, as charts, and as pole figures. These informations are required for a better understanding of the growth mechanism(s) of bulk high-Tc superconductors intended for applications.",
keywords = "Automated mapping, Bulk high- T superconductors, Ceramics, Electron backscatter diffraction, SEM",
author = "Koblischka, {Michael Rudolf} and Koblischka-Veneva, {Anjela Dimitrova}",
year = "2003",
month = "10",
day = "1",
doi = "10.1016/S0921-4534(03)00850-5",
language = "English",
volume = "392-396",
pages = "545--556",
journal = "Physica C: Superconductivity and its Applications",
issn = "0921-4534",
publisher = "Elsevier",
number = "PART 1",

}

TY - JOUR

T1 - Characterization of bulk superconductors through EBSD methods

AU - Koblischka, Michael Rudolf

AU - Koblischka-Veneva, Anjela Dimitrova

PY - 2003/10/1

Y1 - 2003/10/1

N2 - The application of electron backscatter diffraction (EBSD) technique to bulk high-Tc superconductors is presented and reviewed. Due to the ceramic nature and the complex crystallographic unit cells of the perovskite-type high-Tc superconductors, the EBSD analysis is not yet as common as it deserves. We have successfully performed EBSD analysis on a variety of high-Tc compounds and samples including polycrystalline YBCO (pure and doped by alkali metals), melt-textured YBCO, thin and thick films of YBCO; the "green phase" Y2BaCuO5, thin film and melt-textured NdBa2Cu3Ox and Bi-2212 single crystals and tapes. It is shown that the surface preparation of the samples is crucial due to the small information depth (up to 100 nm) of the EBSD technique. High quality Kikuchi patterns are the requirement in order to enable the automated EBSD mapping, which yields phase distributions, individual grain orientations and the misorientation angle distribution. The results can be presented in form of mappings, as charts, and as pole figures. These informations are required for a better understanding of the growth mechanism(s) of bulk high-Tc superconductors intended for applications.

AB - The application of electron backscatter diffraction (EBSD) technique to bulk high-Tc superconductors is presented and reviewed. Due to the ceramic nature and the complex crystallographic unit cells of the perovskite-type high-Tc superconductors, the EBSD analysis is not yet as common as it deserves. We have successfully performed EBSD analysis on a variety of high-Tc compounds and samples including polycrystalline YBCO (pure and doped by alkali metals), melt-textured YBCO, thin and thick films of YBCO; the "green phase" Y2BaCuO5, thin film and melt-textured NdBa2Cu3Ox and Bi-2212 single crystals and tapes. It is shown that the surface preparation of the samples is crucial due to the small information depth (up to 100 nm) of the EBSD technique. High quality Kikuchi patterns are the requirement in order to enable the automated EBSD mapping, which yields phase distributions, individual grain orientations and the misorientation angle distribution. The results can be presented in form of mappings, as charts, and as pole figures. These informations are required for a better understanding of the growth mechanism(s) of bulk high-Tc superconductors intended for applications.

KW - Automated mapping

KW - Bulk high- T superconductors

KW - Ceramics

KW - Electron backscatter diffraction

KW - SEM

UR - http://www.scopus.com/inward/record.url?scp=0042283735&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0042283735&partnerID=8YFLogxK

U2 - 10.1016/S0921-4534(03)00850-5

DO - 10.1016/S0921-4534(03)00850-5

M3 - Conference article

AN - SCOPUS:0042283735

VL - 392-396

SP - 545

EP - 556

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

SN - 0921-4534

IS - PART 1

ER -