Characterization of electroplated, thick permalloy films

S. Getlawi; M. Theis; S. Friedrich; A. Koblischka-Veneva; M. R. Koblischka; M. Saumer; U. Hartmann

doi:10.1002/pssa.200723621

Characterization of electroplated, thick permalloy films

S. Getlawi, M. Theis, S. Friedrich, A. Koblischka-Veneva, M. R. Koblischka, M. Saumer, U. Hartmann

研究成果: Article

4 引用（Scopus）

抜粋

Permalloy (Ni ₁₈Fe ₁₉) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.

元の言語	English
ページ（範囲）	1809-1812
ページ数	4
ジャーナル	Physica Status Solidi (A) Applications and Materials Science
巻	205
発行部数	8
DOI	https://doi.org/10.1002/pssa.200723621
出版物ステータス	Published - 2008 8 1
外部発表	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Electrical and Electronic Engineering
Materials Chemistry

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10.1002/pssa.200723621

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Getlawi, S., Theis, M., Friedrich, S., Koblischka-Veneva, A., Koblischka, M. R., Saumer, M., & Hartmann, U. (2008). Characterization of electroplated, thick permalloy films. Physica Status Solidi (A) Applications and Materials Science, 205(8), 1809-1812. https://doi.org/10.1002/pssa.200723621

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abstract = "Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.",

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AU - Getlawi, S.

AU - Theis, M.

AU - Friedrich, S.

AU - Koblischka-Veneva, A.

AU - Koblischka, M. R.

AU - Saumer, M.

AU - Hartmann, U.

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