抄録
Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 1809-1812 |
| ページ数 | 4 |
| ジャーナル | Physica Status Solidi (A) Applications and Materials Science |
| 巻 | 205 |
| 号 | 8 |
| DOI | |
| 出版ステータス | Published - 2008 8 1 |
| 外部発表 | はい |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
- Materials Chemistry