Characterization of electroplated, thick permalloy films

S. Getlawi, M. Theis, S. Friedrich, Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, M. Saumer, U. Hartmann

研究成果: Article

3 引用 (Scopus)

抄録

Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.

元の言語English
ページ(範囲)1809-1812
ページ数4
ジャーナルPhysica Status Solidi (A) Applications and Materials Science
205
発行部数8
DOI
出版物ステータスPublished - 2008 8 1
外部発表Yes

Fingerprint

Permalloys (trademark)
Thick films
Metal foil
Magnetic force microscopy
Electron diffraction
foils
magnetic force microscopy
Electroplating
Substrates
electroplating
diffraction
Transmission electron microscopy
electrons
wafers
transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

これを引用

Characterization of electroplated, thick permalloy films. / Getlawi, S.; Theis, M.; Friedrich, S.; Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Saumer, M.; Hartmann, U.

:: Physica Status Solidi (A) Applications and Materials Science, 巻 205, 番号 8, 01.08.2008, p. 1809-1812.

研究成果: Article

@article{afe8e0a8a2b44129810e6600360f96c0,
title = "Characterization of electroplated, thick permalloy films",
abstract = "Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.",
author = "S. Getlawi and M. Theis and S. Friedrich and Koblischka-Veneva, {Anjela Dimitrova} and Koblischka, {Michael Rudolf} and M. Saumer and U. Hartmann",
year = "2008",
month = "8",
day = "1",
doi = "10.1002/pssa.200723621",
language = "English",
volume = "205",
pages = "1809--1812",
journal = "Physica Status Solidi (A) Applications and Materials Science",
issn = "1862-6300",
publisher = "Wiley-VCH Verlag",
number = "8",

}

TY - JOUR

T1 - Characterization of electroplated, thick permalloy films

AU - Getlawi, S.

AU - Theis, M.

AU - Friedrich, S.

AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Saumer, M.

AU - Hartmann, U.

PY - 2008/8/1

Y1 - 2008/8/1

N2 - Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.

AB - Permalloy (Ni 18Fe 19) films and foils were fabricated by means of electroplating. Two different types of samples were produced, (i) a patterned permalloy film on a Si wafer (type 1) and (ii) a NiFe foil (type 2), which was separated from the substrate after deposition. The samples were characterized employing magnetic force microscopy (MFM), transmission electron microscopy (TEM) and electron-backscatter diffraction (EBSD). On the foil type sample, MFM reveals a maze domain pattern, and on the structured samples (type 1), a Landau domain pattern is obtained. EBSD enables the identification of the permalloy Kikuchi pattern without the effect of a substrate. The analysis reveals randomly oriented grains with a narrow size distribution.

UR - http://www.scopus.com/inward/record.url?scp=54249120036&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=54249120036&partnerID=8YFLogxK

U2 - 10.1002/pssa.200723621

DO - 10.1002/pssa.200723621

M3 - Article

AN - SCOPUS:54249120036

VL - 205

SP - 1809

EP - 1812

JO - Physica Status Solidi (A) Applications and Materials Science

JF - Physica Status Solidi (A) Applications and Materials Science

SN - 1862-6300

IS - 8

ER -