Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements
M. A. Bodea, J. D. Pedarnig, T. D. Withnell, H. W. Weber, D. A. Cardwell, N. Hari Babu, A. Koblischka-Veneva
研究成果: Article › 査読
3
被引用数
(Scopus)