Characterization of on-chip capacitance effects for I/O circuits and core circuits

Toshio Sudo, Ken Nakano, Junichi Kudo, Satoru Haga

研究成果: Paper査読

9 被引用数 (Scopus)

抄録

This paper presents experimental results of two types of test chips that were with and without on-chip capacitance. Radiated emission and simultaneous switching were characterized by activating I/O circuits or core logic circuits.

本文言語English
ページ73-76
ページ数4
出版ステータスPublished - 2001 12 1
イベントIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
継続期間: 2001 10 292001 10 31

Conference

ConferenceIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
国/地域United States
CityCambridge, MA
Period01/10/2901/10/31

ASJC Scopus subject areas

  • 工学(全般)

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