Compact electrostatic levitator for diffraction measurements with a two axis diffractometer and a laboratory x-ray source

Tadahiko Masaki, Takehiko Ishikawa, Paul Fraņois Paradis, Shinichi Yoda, Junpei T. Okada, Yasuhiro Watanabe, Susumu Nanao, Akiko Ishikura, Kensuke Higuchi, Akitoshi Mizuno, Masato Watanabe, Shinji Kohara

研究成果: Article査読

16 被引用数 (Scopus)

抄録

A compact electrostatic levitator was developed for the structural analysis of high-temperature liquids by x-ray diffraction methods. The size of the levitator was 200 mm in diameter and 200 mm in height and can be set up on a two axis diffractometer with a laboratory x-ray source, which is very convenient in performing structural measurements of high-temperature liquids. In particular, since the laboratory x-ray source allows a great amount of user time, preliminary or challenging experiments can be performed with trial and error, which prepares and complements synchrotron x-ray experiments. The present small apparatus also provides the advantage of portability and facility of setting. To demonstrate the capability of this electrostatic levitator, the static structure factors of alumina and silicon samples in their liquid phases were successfully measured.

本文言語English
論文番号026102
ジャーナルReview of Scientific Instruments
78
2
DOI
出版ステータスPublished - 2007
外部発表はい

ASJC Scopus subject areas

  • 器械工学

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