TY - JOUR
T1 - Comparison of the critical current density of YBCO films obtained by dc sputtering and pulsed laser deposition
AU - Ivan, I.
AU - Miu, L.
AU - Popa, S.
AU - Miu, D.
AU - Mele, P.
AU - Matsumoto, K.
PY - 2010/8/12
Y1 - 2010/8/12
N2 - We measured the critical current density Jc of optimally doped YBa2Cu3O7-δ thin films obtained by dc sputtering on (100) oriented SrTiO3 substrates and by pulsed laser deposition (PLD) on (100) oriented MgO substrates with SrTiO3 buffers. Jc at various temperatures T was determined from the magnetization curves registered with a vibrating sample magnetometer for an external magnetic field H (oriented along the c axis) up to 90 kOe. It was found that Jc of the films obtained by PLD usually overcomes the Jc values of the sputtered films in the whole investigated (H, T) domain.
AB - We measured the critical current density Jc of optimally doped YBa2Cu3O7-δ thin films obtained by dc sputtering on (100) oriented SrTiO3 substrates and by pulsed laser deposition (PLD) on (100) oriented MgO substrates with SrTiO3 buffers. Jc at various temperatures T was determined from the magnetization curves registered with a vibrating sample magnetometer for an external magnetic field H (oriented along the c axis) up to 90 kOe. It was found that Jc of the films obtained by PLD usually overcomes the Jc values of the sputtered films in the whole investigated (H, T) domain.
KW - Critical current density
KW - DC sputtering
KW - Magnetization curves
KW - Pulsed laser deposition
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M3 - Article
AN - SCOPUS:78650359974
VL - 4
SP - 1234
EP - 1245
JO - Optoelectronics and Advanced Materials, Rapid Communications
JF - Optoelectronics and Advanced Materials, Rapid Communications
SN - 1842-6573
IS - 8
ER -