Correlation of measurement and simulation for simultaneous switching noise of FPGA

Yo Takahashi, Yuki Yamamoto, Toshio Sudo, Kunio Ota, Kazuhisa Matsuge

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

FPGAs (Field Programmable Gate Array) are now widely used for prototyping systems as well as mid-volume products. These FPGAs are fabricated by the leading edge CMOS process technology. These may excite false logic transition due to simultaneous switching CMOS output buffers [1]-[4]. In this paper, simultaneous switching noise of FPGA was investigated by both measurement and simulation. First, a precise circuit model was established by extracting the leadframe inductance of the package and including on-chip decoupling capacitance. The power supply impedance of an evaluation board was also simulated. Then, measured waveforms were compared with time-domain simulated results. The simulated time-domain waveforms showed a good agreement with measured waveforms. Moreover, ringing frequency of the measured waveforms was well correlated with the peak of the power supply impedance.

本文言語English
ホスト出版物のタイトル2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
ページ350-353
ページ数4
DOI
出版ステータスPublished - 2010 8 2
イベント2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China
継続期間: 2010 4 122010 4 16

出版物シリーズ

名前2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
CountryChina
CityBeijing
Period10/4/1210/4/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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