Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

A. Koblischka-Veneva, F. Mücklich, M. R. Koblischka, S. Murphy, Y. Zhou, I. V. Shvets

研究成果: Article査読

13 被引用数 (Scopus)

抄録

The crystallographic orientation of magnetite (Fe3 04) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.

本文言語English
ページ(範囲)2873-2875
ページ数3
ジャーナルIEEE Transactions on Magnetics
42
10
DOI
出版ステータスPublished - 2006 10
外部発表はい

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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