Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. D. Koblischka-Veneva, M. R. Koblischka, F. Muecklich, S. Murphy, Y. Zhou, I. V. Shvets

研究成果: Conference contribution

本文言語English
ホスト出版物のタイトルINTERMAG 2006 - IEEE International Magnetics Conference
ページ数1
DOI
出版ステータスPublished - 2006 12 1
外部発表はい
イベントINTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States
継続期間: 2006 5 82006 5 12

出版物シリーズ

名前INTERMAG 2006 - IEEE International Magnetics Conference

Conference

ConferenceINTERMAG 2006 - IEEE International Magnetics Conference
CountryUnited States
CitySan Diego, CA
Period06/5/806/5/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

引用スタイル