Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang; A. I. Kirkland; P. D. Nellist; A. J. D’alfonso; A. J. Morgan; L. J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; M. Shimojo

doi:10.1017/S1431927612004515

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

研究成果: Article › 査読

1 被引用数 (Scopus)

本文言語	English
ページ（範囲）	532-533
ページ数	2
ジャーナル	Microscopy and Microanalysis
巻	18
号	S2
DOI	https://doi.org/10.1017/S1431927612004515
出版ステータス	Published - 2012 7月

ASJC Scopus subject areas

器械工学

文献へのアクセス

10.1017/S1431927612004515

他のファイルとリンク

引用スタイル

Wang, P., Kirkland, A. I., Nellist, P. D., D’alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2012). Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 18(S2), 532-533. https://doi.org/10.1017/S1431927612004515

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