Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang; A. I. Kirkland; P. D. Nellist; A. J. D’alfonso; A. J. Morgan; L. J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; Masayuki Shimojo

doi:10.1017/S1431927612004515

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, Masayuki Shimojo

研究成果: Article

元の言語	English
ページ（範囲）	532-533
ページ数	2
ジャーナル	Microscopy and Microanalysis
巻	18
発行部数	S2
DOI	https://doi.org/10.1017/S1431927612004515
出版物ステータス	Published - 2012

ASJC Scopus subject areas

Instrumentation

これを引用

Wang, P., Kirkland, A. I., Nellist, P. D., D’alfonso, A. J., Morgan, A. J., Allen, L. J., ... Shimojo, M. (2012). Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 18(S2), 532-533. https://doi.org/10.1017/S1431927612004515

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. / Wang, P.; Kirkland, A. I.; Nellist, P. D.; D’alfonso, A. J.; Morgan, A. J.; Allen, L. J.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, Masayuki.

：: Microscopy and Microanalysis, 巻 18, 番号 S2, 2012, p. 532-533.

研究成果: Article

Wang, P, Kirkland, AI, Nellist, PD, D’alfonso, AJ, Morgan, AJ, Allen, LJ, Hashimoto, A, Takeguchi, M, Mitsuishi, K & Shimojo, M 2012, 'Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope', Microscopy and Microanalysis, 巻数 18, 番号 S2, pp. 532-533. https://doi.org/10.1017/S1431927612004515

Wang, P. ; Kirkland, A. I. ; Nellist, P. D. ; D’alfonso, A. J. ; Morgan, A. J. ; Allen, L. J. ; Hashimoto, A. ; Takeguchi, M. ; Mitsuishi, K. ; Shimojo, Masayuki. / Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. ：: Microscopy and Microanalysis. 2012 ; 巻 18, 番号 S2. pp. 532-533.

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文献にアクセス

10.1017/S1431927612004515