Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, Masayuki Shimojo

研究成果: Article

元の言語English
ページ（範囲）532-533
ページ数2
ジャーナルMicroscopy and Microanalysis
巻18
発行部数S2
DOI
出版物ステータスPublished - 2012

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Confocal microscopy
Aberrations
Electron microscopy
aberration
Electron microscopes
electron microscopes
Scanning
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

これを引用

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. / Wang, P.; Kirkland, A. I.; Nellist, P. D.; D’alfonso, A. J.; Morgan, A. J.; Allen, L. J.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, Masayuki.

：: Microscopy and Microanalysis, 巻 18, 番号 S2, 2012, p. 532-533.

研究成果: Article

Wang, P, Kirkland, AI, Nellist, PD, D’alfonso, AJ, Morgan, AJ, Allen, LJ, Hashimoto, A, Takeguchi, M, Mitsuishi, K & Shimojo, M 2012, 'Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope', Microscopy and Microanalysis, 巻. 18, 番号 S2, pp. 532-533. https://doi.org/10.1017/S1431927612004515
Wang P, Kirkland AI, Nellist PD, D’alfonso AJ, Morgan AJ, Allen LJ その他. Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis. 2012;18(S2):532-533. https://doi.org/10.1017/S1431927612004515
Wang, P. ; Kirkland, A. I. ; Nellist, P. D. ; D’alfonso, A. J. ; Morgan, A. J. ; Allen, L. J. ; Hashimoto, A. ; Takeguchi, M. ; Mitsuishi, K. ; Shimojo, Masayuki. / Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. ：: Microscopy and Microanalysis. 2012 ; 巻 18, 番号 S2. pp. 532-533.
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