Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy

X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo

研究成果: Article

元の言語English
ジャーナルDefault journal
出版物ステータスPublished - 2010 8 1

これを引用

Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy. / Zhang, X.; Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Shimojo, M.

：: Default journal, 01.08.2010.

研究成果: Article

Zhang, X, Takeguchi, M, Hashimoto, A, Mitsuishi, K & Shimojo, M 2010, 'Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy', Default journal.
Zhang X, Takeguchi M, Hashimoto A, Mitsuishi K, Shimojo M. Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy. Default journal. 2010 8 1.
Zhang, X. ; Takeguchi, M. ; Hashimoto, A. ; Mitsuishi, K. ; Shimojo, M. / Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron microscopy. ：: Default journal. 2010.
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AU - Shimojo, M.

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