Demonstration experiments of a robot service of stamp-rally and questionnaires for tourism destination marketing

Sachiko Nakagawa, Hiroshi Akutsu, Yosuke Tsuchiya, Nobuto Matsuhira, Masahiko Narita

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

Recently, the concern with tourism destination marketing, which is conducted marketing research from a point of view from a tourism destination, has been growing. We developed a stamp-rally and questionnaire service using robots, with the aim of applying to the marketing research of tourist site and visitors of an exhibition. This robot-service is able to obtain the information and status of tourists by multiple robots, able to aggregate these data, and able to provide them to the stakeholders such event organizers in real time via the Internet. In this paper, we report two evaluation experiments in big events held on Tokyo Big Sight. In addition, we verify the effectiveness of our stamp-rally and questionnaire survey service using robots and devices, and verify the utilization of data obtained.

元の言語English
ホスト出版物のタイトルProceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
出版者Institute of Electrical and Electronics Engineers Inc.
ページ914-919
ページ数6
ISBN(電子版)9781467389853
DOI
出版物ステータスPublished - 2016 8 31
外部発表Yes
イベント5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 - Kumamoto, Japan
継続期間: 2016 7 102016 7 14

Other

Other5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
Japan
Kumamoto
期間16/7/1016/7/14

ASJC Scopus subject areas

  • Information Systems
  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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  • これを引用

    Nakagawa, S., Akutsu, H., Tsuchiya, Y., Matsuhira, N., & Narita, M. (2016). Demonstration experiments of a robot service of stamp-rally and questionnaires for tourism destination marketing. : Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 (pp. 914-919). [7557743] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IIAI-AAI.2016.214