Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples

M. Takeguchi, A. Hashimoto, K. Mitsuishi, X. Zhang, M. Shimojo, T. Ishikawa, S. Deguchi, T. Naruse, Y. Kondo

研究成果: Article

元の言語English
ジャーナルDefault journal
出版物ステータスPublished - 2010 6 1

これを引用

Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. / Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Zhang, X.; Shimojo, M.; Ishikawa, T.; Deguchi, S.; Naruse, T.; Kondo, Y.

:: Default journal, 01.06.2010.

研究成果: Article

Takeguchi, M, Hashimoto, A, Mitsuishi, K, Zhang, X, Shimojo, M, Ishikawa, T, Deguchi, S, Naruse, T & Kondo, Y 2010, 'Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples', Default journal.
Takeguchi, M. ; Hashimoto, A. ; Mitsuishi, K. ; Zhang, X. ; Shimojo, M. ; Ishikawa, T. ; Deguchi, S. ; Naruse, T. ; Kondo, Y. / Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. :: Default journal. 2010.
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AU - Takeguchi, M.

AU - Hashimoto, A.

AU - Mitsuishi, K.

AU - Zhang, X.

AU - Shimojo, M.

AU - Ishikawa, T.

AU - Deguchi, S.

AU - Naruse, T.

AU - Kondo, Y.

PY - 2010/6/1

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