| 元の言語 | English |
|---|---|
| ジャーナル | Default journal |
| 出版物ステータス | Published - 2010 6 1 |
これを引用
Takeguchi, M., Hashimoto, A., Mitsuishi, K., Zhang, X., Shimojo, M., Ishikawa, T., ... Kondo, Y. (2010). Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. Default journal.
Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. / Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Zhang, X.; Shimojo, M.; Ishikawa, T.; Deguchi, S.; Naruse, T.; Kondo, Y.
：: Default journal, 01.06.2010.研究成果: Article
Takeguchi, M, Hashimoto, A, Mitsuishi, K, Zhang, X, Shimojo, M, Ishikawa, T, Deguchi, S, Naruse, T & Kondo, Y 2010, 'Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples', Default journal.
Takeguchi M, Hashimoto A, Mitsuishi K, Zhang X, Shimojo M, Ishikawa T その他. Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. Default journal. 2010 6 1.
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AU - Takeguchi, M.
AU - Hashimoto, A.
AU - Mitsuishi, K.
AU - Zhang, X.
AU - Shimojo, M.
AU - Ishikawa, T.
AU - Deguchi, S.
AU - Naruse, T.
AU - Kondo, Y.
PY - 2010/6/1
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