Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples

M. Takeguchi, A. Hashimoto, K. Mitsuishi, X. Zhang, M. Shimojo, T. Ishikawa, S. Deguchi, T. Naruse, Y. Kondo

研究成果: Article › 査読

引用スタイル

@article{4dfa266cb0184bf5a716e62abebf8076,

title = "Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples",

author = "M. Takeguchi and A. Hashimoto and K. Mitsuishi and X. Zhang and M. Shimojo and T. Ishikawa and S. Deguchi and T. Naruse and Y. Kondo",

year = "2010",

month = jun,

day = "1",

language = "English",

journal = "Default journal",

}

TY - JOUR

T1 - Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples

AU - Takeguchi, M.

AU - Hashimoto, A.

AU - Mitsuishi, K.

AU - Zhang, X.

AU - Shimojo, M.

AU - Ishikawa, T.

AU - Deguchi, S.

AU - Naruse, T.

AU - Kondo, Y.

PY - 2010/6/1

Y1 - 2010/6/1

M3 - Article

JO - Default journal

JF - Default journal

ER -