Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples

M. Takeguchi, A. Hashimoto, K. Mitsuishi, X. Zhang, M. Shimojo, T. Ishikawa, S. Deguchi, T. Naruse, Y. Kondo

研究成果: Article

元の言語English
ジャーナルDefault journal
出版物ステータスPublished - 2010 6 1

これを引用

Takeguchi, M., Hashimoto, A., Mitsuishi, K., Zhang, X., Shimojo, M., Ishikawa, T., Deguchi, S., Naruse, T., & Kondo, Y. (2010). Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples. Default journal.