Different origins of Tc-suppression in YBa2(Cu1−xMx)3Oy(M=Co and Zn)

Shoji Terada, Norio Kobayashi, Hideo Iwasaki, Ayako Tokiwa, Masae Kikuchi, Yasuhiko Syono, Yoshio Muto

研究成果: Article査読

5 被引用数 (Scopus)

抄録

The electrical resistivity, the Hall effect and the oxygen content have been measured for YBa2(Cu1−xMx)3Oy(M=Co and Zn). The electrical resistivity increases with concentration x in both systems. The carrier concentration decreases with x for M=Co, while it remains almost constant for M=Zn. The suppression of Tc in the Co-doped system is explained by the reduction in carrier. In the Zn-doped system, on the other hand, the suppression seems to be caused by the electron localization in Cu-O planes.

本文言語English
ページ(範囲)1545-1546
ページ数2
ジャーナルPhysica B: Condensed Matter
165-166
DOI
出版ステータスPublished - 1990
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学

フィンガープリント

「Different origins of T<sub>c</sub>-suppression in YBa<sub>2</sub>(Cu<sub>1−x</sub>M<sub>x</sub>)<sub>3</sub>O<sub>y</sub>(M=Co and Zn)」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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