Direct determination of the interlayer van der Waals bonding force in 2D indium selenide semiconductor crystal

Tadao Tanabe, Chao Tang, Yohei Sato, Yutaka Oyama

研究成果: Article査読

3 被引用数 (Scopus)

抄録

The interlayer van der Waals bonding force in crystalline InSe was directly measured using a mechanical test equipment. The bulk γ-InSe crystal was grown by the temperature difference method under controlled vapor pressure, a unique liquid phase solution crystal growth method with a low and fixed growth temperature. The measured bonding force in the crystal was 20.8 N/cm2, which is greater than that in 2D crystalline GaSe. We also made theoretical discussion of the van der Waals forces in InSe, based on the fluctuations in the electron cloud distributions around the atoms.

本文言語English
論文番号245107
ジャーナルJournal of Applied Physics
123
24
DOI
出版ステータスPublished - 2018 6 28
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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