Effect of Silver Content on the Shear Fatigue Properties of Sn-Ag-Cu Flip-Chip Interconnects

Yoshiharu Kariya, Takuya Hosoi, Shinichi Terashima, Masamoto Tanaka, Masahisa Otsuka

研究成果: Article査読

81 被引用数 (Scopus)

抄録

The mechanical shear fatigue test has been performed to study the effect of silver content on the fatigue properties of Sn-xAg-0.5Cu (x = 1, 2, 3, and 4) for flip-chip interconnections. The strength of the solder alloy increases with increasing silver content, preventing shear plastic deformation of the solder bump. The flip-chip joints made using higher silver content solder, such as 3%Ag and 4%Ag, exhibit longer fatigue life for all conditions. The fatigue ductility of the solder decreases with an increase in the silver content. The fatigue endurance of 1%Ag solder is superior to other solders over the plastic strain range of 3%, even though the strength of the solder is the lowest in the solders tested. Based on this study, the 3Ag solder may exhibit good fatigue performance for all conditions, and the 1Ag solder is optimum for severe strain conditions.

本文言語English
ページ(範囲)321-328
ページ数8
ジャーナルJournal of Electronic Materials
33
4
DOI
出版ステータスPublished - 2004 4月
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学
  • 材料化学

フィンガープリント

「Effect of Silver Content on the Shear Fatigue Properties of Sn-Ag-Cu Flip-Chip Interconnects」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル