Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-Tc superconductors

T. Muraoka, N. Chikumoto, T. Machi, I. Hirabayashi, M. Murakami

研究成果: Conference article

抄録

We have performed local magnetization measurements on Bi 2SrCa2Cu2O8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.

本文言語English
ページ(範囲)88-93
ページ数6
ジャーナルPhysica C: Superconductivity and its applications
426-431
I
DOI
出版ステータスPublished - 2005 10 1
イベントProceedings of the 17th International Symposium on Superconductivity (ISS 2004) Advances in Supeconductivity -
継続期間: 2004 11 232004 11 25

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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