Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-Tc superconductors

T. Muraoka; N. Chikumoto; T. Machi; I. Hirabayashi; M. Murakami

doi:10.1016/j.physc.2005.03.082

Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-T_c superconductors

T. Muraoka, N. Chikumoto, T. Machi, I. Hirabayashi, M. Murakami

研究成果: Conference article › 査読

抄録

We have performed local magnetization measurements on Bi ₂SrCa₂Cu₂O_8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.

本文言語	English
ページ（範囲）	88-93
ページ数	6
ジャーナル	Physica C: Superconductivity and its applications
巻	426-431
号	I
DOI	https://doi.org/10.1016/j.physc.2005.03.082
出版ステータス	Published - 2005 10月 1
イベント	Proceedings of the 17th International Symposium on Superconductivity (ISS 2004) Advances in Supeconductivity - 継続期間: 2004 11月 23 → 2004 11月 25

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
凝縮系物理学
エネルギー工学および電力技術
電子工学および電気工学

文献へのアクセス

10.1016/j.physc.2005.03.082

他のファイルとリンク

フィンガープリント

「Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-T_c superconductors」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル

@article{960835fdef644de597e0dcc7449e403f,

title = "Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-Tc superconductors",

abstract = "We have performed local magnetization measurements on Bi 2SrCa2Cu2O8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.",

keywords = "Bi2212, Bitter decoration, Chemical inhomogeneity, Magneto-optical imaging",

author = "T. Muraoka and N. Chikumoto and T. Machi and I. Hirabayashi and M. Murakami",

note = "Funding Information: This work was supported by the New Energy and Industrial Technology Development Organization (NEDO) as Collaborative Research and Development of Fundamental Technologies for Superconductivity Applications.; Proceedings of the 17th International Symposium on Superconductivity (ISS 2004) Advances in Supeconductivity ; Conference date: 23-11-2004 Through 25-11-2004",

year = "2005",

month = oct,

day = "1",

doi = "10.1016/j.physc.2005.03.082",

language = "English",

volume = "426-431",

pages = "88--93",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "I",

}

TY - JOUR

T1 - Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-Tc superconductors

AU - Muraoka, T.

AU - Chikumoto, N.

AU - Machi, T.

AU - Hirabayashi, I.

AU - Murakami, M.

N1 - Funding Information: This work was supported by the New Energy and Industrial Technology Development Organization (NEDO) as Collaborative Research and Development of Fundamental Technologies for Superconductivity Applications.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - We have performed local magnetization measurements on Bi 2SrCa2Cu2O8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.

AB - We have performed local magnetization measurements on Bi 2SrCa2Cu2O8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.

KW - Bi2212

KW - Bitter decoration

KW - Chemical inhomogeneity

KW - Magneto-optical imaging

UR - http://www.scopus.com/inward/record.url?scp=25644459967&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=25644459967&partnerID=8YFLogxK

U2 - 10.1016/j.physc.2005.03.082

DO - 10.1016/j.physc.2005.03.082

M3 - Conference article

AN - SCOPUS:25644459967

SN - 0921-4534

VL - 426-431

SP - 88

EP - 93

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

IS - I

T2 - Proceedings of the 17th International Symposium on Superconductivity (ISS 2004) Advances in Supeconductivity

Y2 - 23 November 2004 through 25 November 2004

ER -