We have performed local magnetization measurements on Bi 2SrCa2Cu2O8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.
|ジャーナル||Physica C: Superconductivity and its applications|
|出版ステータス||Published - 2005 10月 1|
|イベント||Proceedings of the 17th International Symposium on Superconductivity (ISS 2004) Advances in Supeconductivity - |
継続期間: 2004 11月 23 → 2004 11月 25
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