Effects of buffer impurities and field plate on breakdown performance in small-sized AlGaN/GaN HEMTs

H. Onodera, A. Nakajima, K. Horio

研究成果: Article査読

本文言語English
ジャーナルAbstracts of the 9th International Conference on Nitride Semiconductors (ICNS-9), Glasgow, United Kingdom, J1.6
出版ステータスPublished - 2011 7 13

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