Effects of buffer impurities and field plate on breakdown performance in small-sized AlGaN/GaN HEMTs

H. Onodera, A. Nakajima, K. Horio

研究成果: Article › 査読

本文言語	English
ジャーナル	Abstracts of the 9th International Conference on Nitride Semiconductors (ICNS-9), Glasgow, United Kingdom, J1.6
出版ステータス	Published - 2011 7月 13

引用スタイル

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AU - Onodera, H.

AU - Nakajima, A.

AU - Horio, K.

PY - 2011/7/13

Y1 - 2011/7/13

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JF - Abstracts of the 9th International Conference on Nitride Semiconductors (ICNS-9), Glasgow, United Kingdom, J1.6

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