Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB

Satoru Haga, Ken Nakano, Toshio Sudo

研究成果: Paper

3 引用 (Scopus)

抜粋

Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.

元の言語English
ページ25-28
ページ数4
出版物ステータスPublished - 2001 12 1
イベントIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
継続期間: 2001 10 292001 10 31

Conference

ConferenceIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
United States
Cambridge, MA
期間01/10/2901/10/31

ASJC Scopus subject areas

  • Engineering(all)

フィンガープリント Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Haga, S., Nakano, K., & Sudo, T. (2001). Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB. 25-28. 論文発表場所 IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging, Cambridge, MA, United States.