Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

K. Horio, A. Nakajima, K. Itagaki

研究成果: Conference contribution

1 被引用数 (Scopus)
本文言語English
ホスト出版物のタイトル65th DRC Device Research Conference
ページ67-68
ページ数2
DOI
出版ステータスPublished - 2007 12 1
イベント65th DRC Device Research Conference - South Bend, India
継続期間: 2007 6 182007 6 20

出版物シリーズ

名前65th DRC Device Research Conference

Conference

Conference65th DRC Device Research Conference
CountryIndia
CitySouth Bend
Period07/6/1807/6/20

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

引用スタイル