Efficient leakage power saving by sleep depth controlling for multi-mode power gating

Seidai Takeda, Shinobu Miwa, Kimiyoshi Usami, Hiroshi Nakamura

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

Power Gating (PG) and Body Biasing (BB) are effective schemes to save leakage power in standby-time. However, in run-time, their large overhead energy and latency for sleep control prevent the circuit from saving power in short idle times. To reduce those overheads, advanced PG and BB using shallow sleep mode are studied. Those circuits achieve leakage saving even in short idle time. The depth of sleep mode has trade-offs between the overheads and the amount of saved leakage power; hence, making decision of depth of a shallow sleep is an important issue to maximize total leakage saving. However, the depth which achieves best leakage saving depends heavily on run-time factors, such as application behavior and temperature. Thus, the conventional circuit has multiple shallow sleep modes and chooses an adequate mode in run-time. However, it causes large overhead power because of additional voltage generators for shallow sleep modes. In this paper, we propose a sleep control scheme named Opt-static for run-time leakage saving. Our scheme uses only one shallow sleep mode, but its depth is reconfigurable. It successfully achieves leakage saving by adopting its depth with run-time factors. In addition, our scheme needs only one active voltage generator; hence overhead power associated with voltage generators is smaller than the conventional circuit which has multiple shallow sleep modes. Experimental results show that our schemes applied to Multi-mode PG achieves higher leakage saving than the conventional Multi-mode PG which has two shallow sleep modes, although it does not take into account for overhead power of voltage generators.

本文言語English
ホスト出版物のタイトルProceedings of the 13th International Symposium on Quality Electronic Design, ISQED 2012
ページ625-632
ページ数8
DOI
出版ステータスPublished - 2012 7 16
イベント13th International Symposium on Quality Electronic Design, ISQED 2012 - Santa Clara, CA, United States
継続期間: 2012 3 192012 3 21

出版物シリーズ

名前Proceedings - International Symposium on Quality Electronic Design, ISQED
ISSN(印刷版)1948-3287
ISSN(電子版)1948-3295

Conference

Conference13th International Symposium on Quality Electronic Design, ISQED 2012
国/地域United States
CitySanta Clara, CA
Period12/3/1912/3/21

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学
  • 安全性、リスク、信頼性、品質管理

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