Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging

Toshio Sudo; Yakushi Ko; Shingo Sakaguchi; Takeji Tokumaru

Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging

Toshio Sudo, Yakushi Ko, Shingo Sakaguchi, Takeji Tokumaru

電気電子情報工学専攻

研究成果: Conference article › 査読

8 被引用数 (Scopus)

抄録

The effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using transverse electromagnetic (TEM) cell and a near-field probe system. Further, the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model.

本文言語	English
ページ（範囲）	781-785
ページ数	5
ジャーナル	Proceedings - Electronic Components and Technology Conference
出版ステータス	Published - 2000 12月 1

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
電子工学および電気工学

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title = "Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging",

abstract = "The effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using transverse electromagnetic (TEM) cell and a near-field probe system. Further, the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model.",

author = "Toshio Sudo and Yakushi Ko and Shingo Sakaguchi and Takeji Tokumaru",

year = "2000",

month = dec,

day = "1",

language = "English",

pages = "781--785",

journal = "Proceedings - Electronic Components and Technology Conference",

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T1 - Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging

AU - Sudo, Toshio

AU - Ko, Yakushi

AU - Sakaguchi, Shingo

AU - Tokumaru, Takeji

PY - 2000/12/1

Y1 - 2000/12/1

N2 - The effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using transverse electromagnetic (TEM) cell and a near-field probe system. Further, the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model.

AB - The effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using transverse electromagnetic (TEM) cell and a near-field probe system. Further, the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model.

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UR - http://www.scopus.com/inward/citedby.url?scp=0034476174&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0034476174

SN - 0569-5503

SP - 781

EP - 785

JO - Proceedings - Electronic Components and Technology Conference

JF - Proceedings - Electronic Components and Technology Conference

ER -

Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging

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ASJC Scopus subject areas

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