Electron backscatter diffraction analysis applied to [0 0 1] magnetite thin films grown on MgO substrates

A. Koblischka-Veneva, M. R. Koblischka, Y. Zhou, S. Murphy, F. Mücklich, U. Hartmann, I. V. Shvets

研究成果: Article査読

7 被引用数 (Scopus)

抄録

Electron backscatter diffraction (EBSD) analysis is applied to [0 0 1] oriented magnetite thin films grown on MgO substrates. A high image quality of the Kikuchi patterns was achieved enabling multi-phase scans. Several types of magnetite thin films were analyzed; one as-grown and the others after different annealing steps in oxygen atmosphere. From the EBSD mappings, we learn that the optimum orientation in [0 0 1]-direction is not yet achieved for the as-grown sample, but develops upon oxygen treatment. Furthermore, the distribution of misorientation angles within the investigated area (=1 grain) is found to change during the annealing steps. After 3 min of annealing, most of the misorientations around 30°-40° have vanished, and some islands with high misorientation angles remain, which may play a role as antiferromagnetic pinning centers.

本文言語English
ページ(範囲)e663-e665
ジャーナルJournal of Magnetism and Magnetic Materials
316
2 SPEC. ISS.
DOI
出版ステータスPublished - 2007 9
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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