Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures

Toshio Sudo, Toshimi Kato, Seiju Ichijo

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

The relationship between S21 properties and far-field radiated emission has been experimentally characterized for various types of power bus structures. As design parameters of power bus structures in printed circuit boards, the effects of VDD plane configuration, insulator thickness between VDD plane and ground plane, on-board capacitors, and signal routing were investigated. First, S21 properties of solid and electromagnetic band-gap (EBG)-type VDD planes were measured for both with and without on-board capacitors. Then, far-field radiated emission was measured for the combination of these design parameters. On-board capacitors induced stop-band in the low frequency range. It has been found that high level of far-field radiated emission was excited at the almost same frequencies of S21 peaks.

本文言語English
ホスト出版物のタイトル2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
出版社Institute of Electrical and Electronics Engineers Inc.
ページ692-695
ページ数4
ISBN(印刷版)142440293X, 9781424402939
DOI
出版ステータスPublished - 2006
外部発表はい
イベント2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, OR, United States
継続期間: 2006 8月 142006 8月 18

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
3
ISSN(印刷版)1077-4076

Conference

Conference2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
国/地域United States
CityPortland, OR
Period06/8/1406/8/18

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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