Experimental characterization of simultaneous switching noise for multichip module

Kenji Ito, Katsuto Kato, Naohiko Hirano, Toshio Sudo

研究成果: Paper

2 引用 (Scopus)

抜粋

CMOS-based multichip modules have been actively developed for achieving high performance and high speed systems. Simultaneous switching noise (SSN) induced by CMOS output buffers is a serious issue in multichip modules as well as single-chip packages to ensure stable operation and to derive inherent speed performance. Multichip modules are expected to have smaller switching noise level than the case of single-chip packages by removing a first-level package and its parasitics. This paper reports the measurement results of switching noises for different types of MCMs using a switching noise generating chip. Two types of test vehicles were fabricated and measurement results were compared. Noise distribution on a ground plane was also measured.

元の言語English
ページ217-220
ページ数4
出版物ステータスPublished - 1995 1 1
イベントProceedings of the 1995 IEEE Multi-Chip Module Conference - Santa Cruz, CA, USA
継続期間: 1995 1 311995 2 2

Other

OtherProceedings of the 1995 IEEE Multi-Chip Module Conference
Santa Cruz, CA, USA
期間95/1/3195/2/2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • これを引用

    Ito, K., Kato, K., Hirano, N., & Sudo, T. (1995). Experimental characterization of simultaneous switching noise for multichip module. 217-220. 論文発表場所 Proceedings of the 1995 IEEE Multi-Chip Module Conference, Santa Cruz, CA, USA, .