We analyzed the effect of a Ti seed layer on the agglomeration of Ag films grown on MgO(110) substrates. The samples were deposited at room temperature and post-annealed at 350°C for 4 h. Atomic force microscopy observations indicated that the insertion of the Ti seed layer between the substrate and Ag promoted the agglomeration, leading to nanorod formation. X-ray diffraction analyses showed that the Ag/Ti film grown on MgO(110) substrate yielded fcc-Ag(110)-oriented epitaxial nanorods. Additionally, typical optical absorbance spectra of the Ag nanorods were obtained in the Ag/Ti films.
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