Fatigue life and fracture behavior of micro size Sn-Ag-Cu solder joint

Tashiro Naoki, Yoshiharu Kariya, Yoshihiko Kanda

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

The influence of the joint size on low cycle fatigue characteristic of Sn-Ag-Cu has been investigated by a micro size joint specimen fabricated using solder balls. Although the effect of joint size on crack initiation life is not obvious at 298K, the reduction of the joint size changes the cyclic strain hardening nature and the fracture behavior that induces the life reduction at 398K. With a decrease in size, the failure mechanism transforms from a transgranular fracture to an intergranular fracture at the high energy grain boundary that is formed by high angle boundary formation following dynamic recovery in whole of joint. Therefore, the failure life is greatly reduced as a complete failure occurs simultaneously with the crack initiation at the grain boundaries. This is more remarkable at higher temperatures.

元の言語English
ホスト出版物のタイトルASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, InterPACK 2011
ページ707-712
ページ数6
DOI
出版物ステータスPublished - 2011 12 1
イベントASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, InterPACK 2011 - Portland, OR, United States
継続期間: 2011 7 62011 7 8

出版物シリーズ

名前ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, InterPACK 2011
2

Conference

ConferenceASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, InterPACK 2011
United States
Portland, OR
期間11/7/611/7/8

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • これを引用

    Naoki, T., Kariya, Y., & Kanda, Y. (2011). Fatigue life and fracture behavior of micro size Sn-Ag-Cu solder joint. : ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, InterPACK 2011 (pp. 707-712). (ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, InterPACK 2011; 巻数 2). https://doi.org/10.1115/IPACK2011-52104