Flux penetration into YBa2Cu3Ox thin films covering substrate step edges

Th Schuster, M. R. Koblischka, H. Kuhn, H. Kronmüller, G. Friedl, B. Roas, L. Schultz

研究成果: Article査読

13 被引用数 (Scopus)

抄録

Using the high-resolution Faraday effect, the flux penetration into YBa2Cu3Ox thin films grown over one or two substrate step edges is directly observed at a temperature of T=5 K. The regions at the steps are easily penetrated by the flux already present at low applied external magnetic fields due to the locally enhanced stray fields. The step edges are found to separate the sample magnetically into independent parts. It is also shown that the local observation of flux penetration allows detection of the influence of defects in the thin-film samples on the domain structures in a direct way.

本文言語English
ページ(範囲)768-770
ページ数3
ジャーナルApplied Physics Letters
62
7
DOI
出版ステータスPublished - 1993
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

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