Flux penetration into YBa2Cu3Ox thin films covering substrate step edges

Th Schuster, M. R. Koblischka, H. Kuhn, H. Kronmüller, G. Friedl, B. Roas, L. Schultz

研究成果: Article

11 引用 (Scopus)

抜粋

Using the high-resolution Faraday effect, the flux penetration into YBa2Cu3Ox thin films grown over one or two substrate step edges is directly observed at a temperature of T=5 K. The regions at the steps are easily penetrated by the flux already present at low applied external magnetic fields due to the locally enhanced stray fields. The step edges are found to separate the sample magnetically into independent parts. It is also shown that the local observation of flux penetration allows detection of the influence of defects in the thin-film samples on the domain structures in a direct way.

元の言語English
ページ(範囲)768-770
ページ数3
ジャーナルApplied Physics Letters
62
発行部数7
DOI
出版物ステータスPublished - 1993 12 1
外部発表Yes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

フィンガープリント Flux penetration into YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> thin films covering substrate step edges' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Schuster, T., Koblischka, M. R., Kuhn, H., Kronmüller, H., Friedl, G., Roas, B., & Schultz, L. (1993). Flux penetration into YBa2Cu3Ox thin films covering substrate step edges. Applied Physics Letters, 62(7), 768-770. https://doi.org/10.1063/1.108573