TY - GEN
T1 - High speed cell stiffness evaluation toward 100% reliability
AU - Hirose, Yuki
AU - Kaneko, Makoto
AU - Kawahara, Tomohiro
AU - Yamanishi, Yoko
AU - Arai, Fumihito
PY - 2011/12/1
Y1 - 2011/12/1
N2 - This paper proposes a high speed cell stiffness evaluation with high reliability. The procedure includes both online measurement and offline inspection. By using the property where the passing time of the cell in the micro channel is a function of the cell stiffness and its size, a real time vision system whose handling frequency is 6 kHz can capture the size as well as the passing time of each cell. During the online measurement, we save two image data at both the entrance and the exit for each cell. In offline manual inspection, all doubtful data are killed so that we can make sure the reliability. Experimental results ensure that the proposed approach can handle 500 cells within 10min in including both online and offline procedures.
AB - This paper proposes a high speed cell stiffness evaluation with high reliability. The procedure includes both online measurement and offline inspection. By using the property where the passing time of the cell in the micro channel is a function of the cell stiffness and its size, a real time vision system whose handling frequency is 6 kHz can capture the size as well as the passing time of each cell. During the online measurement, we save two image data at both the entrance and the exit for each cell. In offline manual inspection, all doubtful data are killed so that we can make sure the reliability. Experimental results ensure that the proposed approach can handle 500 cells within 10min in including both online and offline procedures.
UR - http://www.scopus.com/inward/record.url?scp=84856872649&partnerID=8YFLogxK
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U2 - 10.1109/ICSENS.2011.6127399
DO - 10.1109/ICSENS.2011.6127399
M3 - Conference contribution
AN - SCOPUS:84856872649
SN - 9781424492886
T3 - Proceedings of IEEE Sensors
SP - 962
EP - 965
BT - IEEE Sensors 2011 Conference, SENSORS 2011
T2 - 10th IEEE SENSORS Conference 2011, SENSORS 2011
Y2 - 28 October 2011 through 31 October 2011
ER -