Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy

K. Mitsuishi, A. Hashimoto, M. Takeguchi, Masayuki Shimojo, K. Ishizuka

研究成果: Article

19 引用 (Scopus)

抄録

Imaging properties of scanning confocal electron microscopy (SCEM) were studied by calculating simple model systems using the multislice method. A simple geometrical explanation was given, particularly for the difference between bright field (BF) and annular dark field (ADF) SCEM. It is demonstrated that the BF-SCEM image contrast consists of two features. One gradually changes over a wide defocus range and depends on the lateral size of the object. Another appears only near the focus and is independent of sample size. On the contrary, ADF-SCEM image contrast does not depend on the lateral size of the object. Therefore, the ADF-SCEM will provide more readily interpretable image contrast.

元の言語English
ページ(範囲)20-26
ページ数7
ジャーナルUltramicroscopy
111
発行部数1
DOI
出版物ステータスPublished - 2010 12
外部発表Yes

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Confocal microscopy
Electron microscopy
Scanning
Imaging techniques
image contrast
scanning electron microscopy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

これを引用

Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy. / Mitsuishi, K.; Hashimoto, A.; Takeguchi, M.; Shimojo, Masayuki; Ishizuka, K.

:: Ultramicroscopy, 巻 111, 番号 1, 12.2010, p. 20-26.

研究成果: Article

Mitsuishi, K. ; Hashimoto, A. ; Takeguchi, M. ; Shimojo, Masayuki ; Ishizuka, K. / Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy. :: Ultramicroscopy. 2010 ; 巻 111, 番号 1. pp. 20-26.
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