In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele, Kaname Matsumoto, Yasunori Haruyama, Masashi Mukaida, Yutaka Yoshida, Yusuke Ichino, Takanobu Kiss, Ataru Ichinose

研究成果: Article

23 引用 (Scopus)

抄録

Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc 0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

元の言語English
記事番号052001
ジャーナルSuperconductor Science and Technology
23
発行部数5
DOI
出版物ステータスPublished - 2010 5 4
外部発表Yes

Fingerprint

Epitaxial films
Thin films
Pulsed laser deposition
thin films
pulsed laser deposition
Film thickness
film thickness
Single crystals
single crystals
Substrates
strontium titanium oxide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Ceramics and Composites
  • Materials Chemistry
  • Metals and Alloys

これを引用

In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties. / Mele, Paolo; Matsumoto, Kaname; Haruyama, Yasunori; Mukaida, Masashi; Yoshida, Yutaka; Ichino, Yusuke; Kiss, Takanobu; Ichinose, Ataru.

:: Superconductor Science and Technology, 巻 23, 番号 5, 052001, 04.05.2010.

研究成果: Article

Mele, Paolo ; Matsumoto, Kaname ; Haruyama, Yasunori ; Mukaida, Masashi ; Yoshida, Yutaka ; Ichino, Yusuke ; Kiss, Takanobu ; Ichinose, Ataru. / In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties. :: Superconductor Science and Technology. 2010 ; 巻 23, 番号 5.
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AU - Mele, Paolo

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AU - Mukaida, Masashi

AU - Yoshida, Yutaka

AU - Ichino, Yusuke

AU - Kiss, Takanobu

AU - Ichinose, Ataru

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