In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase

H. Oguchi, Z. Tan, E. J. Heilweil, L. A. Bendersky

研究成果: Article査読

8 被引用数 (Scopus)

抄録

In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg98.4Ti1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH2 layer on top followed by drastically slower growth of the MgH2 phase. The initial averaged growth rate of the MgH2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.

本文言語English
ページ(範囲)1296-1299
ページ数4
ジャーナルInternational Journal of Hydrogen Energy
35
3
DOI
出版ステータスPublished - 2010 2月
外部発表はい

ASJC Scopus subject areas

  • 再生可能エネルギー、持続可能性、環境
  • 燃料技術
  • 凝縮系物理学
  • エネルギー工学および電力技術

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