TY - GEN
T1 - Influence of analysis parameters on the microstructural characterization of nanoscale precipitates
AU - Serizawa, Ai
AU - Miller, M. K.
PY - 2010/12/1
Y1 - 2010/12/1
N2 - A series of simulated microstructures containing nanometer-scale precipitates was created with an atom probe data simulator. These data were then analyzed with the proximity histogram by creating isoconcentration surfaces to determine the influence of the analysis method. For simulated 2-nm-radius spherical precipitates, the optimized voxel size and delocalization were found to be 0.5-0.6 nm and 1.0-1.5 nm, respectively. Under optimum analysis parameters, the voxelization/delocalization process only slightly degrades the interface width determined from the proximity histogram to ∼0.15±0.04 nm.
AB - A series of simulated microstructures containing nanometer-scale precipitates was created with an atom probe data simulator. These data were then analyzed with the proximity histogram by creating isoconcentration surfaces to determine the influence of the analysis method. For simulated 2-nm-radius spherical precipitates, the optimized voxel size and delocalization were found to be 0.5-0.6 nm and 1.0-1.5 nm, respectively. Under optimum analysis parameters, the voxelization/delocalization process only slightly degrades the interface width determined from the proximity histogram to ∼0.15±0.04 nm.
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M3 - Conference contribution
AN - SCOPUS:79951990745
SN - 9781617822124
T3 - Materials Research Society Symposium Proceedings
SP - 19
EP - 25
BT - Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution
T2 - 2009 MRS Fall Meeting
Y2 - 30 November 2009 through 4 December 2009
ER -