Investigation of melt-textured superconductors on the nanoscale

研究成果: Article査読

4 被引用数 (Scopus)

抄録

For the further development of the bulk, melt-processed high-Tc superconductors it is an essential issue to control the material properties on the nanoscale, as the length scale where flux pinning takes place is of the order of 10 nm. As a consequence, we need to investigate the properties of the samples accordingly on the nanoscale. Therefore, we have performed atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) scans of sample surfaces at ambient conditions which have resolved a rich variety of microstructures in the bulk samples. With the recent developments, also the (electron backscatter diffraction) EBSD technique reaches the nanometre range enabling to study the crystallographic details, especially the effect of embedded nanoparticles on the superconducting matrix. In order to obtain a direct proof of the pinning effect, the output of low-temperature STM revealing the electronic nature of the samples is studied as well. Further developments of the STM technique, e.g., employing ferromagnetic tips, may further bring informations on the flux pinning properties.

本文言語English
ページ(範囲)47-52
ページ数6
ジャーナルMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
151
1
DOI
出版ステータスPublished - 2008 6月 15
外部発表はい

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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