Low temperature scanning force microscopy using piezoresistive cantilevers

P. Meiser, Michael Rudolf Koblischka, U. Hartmann

研究成果: Article査読

1 被引用数 (Scopus)

抄録

A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

本文言語English
論文番号085903
ジャーナルMeasurement Science and Technology
26
8
DOI
出版ステータスPublished - 2015 8月 1
外部発表はい

ASJC Scopus subject areas

  • 器械工学
  • 工学(その他)
  • 応用数学

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