Low temperature scanning force microscopy using piezoresistive cantilevers

P. Meiser, Michael Rudolf Koblischka, U. Hartmann

研究成果: Article

1 引用 (Scopus)

抜粋

A low temperature dynamic scanning force microscope has been constructed using commercially available piezoresistive cantilevers that can be coated with a ferromagnetic material for MFM application. The setup is able to work in a temperature range from room temperature down to 1.5 K. The performance of the piezoresistive cantilevers has been investigated under different working conditions. Topographic as well as magnetic images of a magnetite thin film sample have been taken at 50 and 4.2 K confirming the proper operation of the microscope at cryogenic temperatures. Furthermore, force-distance-curves taken on thin lead films at 4.2 K demonstrate the levitation forces between the magnetized cantilever tip and the superconducting films. Flux lines were generated by the magnetized cantilever tip itself when approaching the sample. It has also been shown that the microscope is sensitive to the detection of single magnetic flux lines penetrating the lead films.

元の言語English
記事番号085903
ジャーナルMeasurement Science and Technology
26
発行部数8
DOI
出版物ステータスPublished - 2015 8 1
外部発表Yes

ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

フィンガープリント Low temperature scanning force microscopy using piezoresistive cantilevers' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用