Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

M.Iwanami M.Iwanami, E.Yamazaki E.Yamazaki, K.Nakano K.Nakano, T.Sudo T.Sudo, S.Haga S.Haga, S.Hoshino S.Hoshino, S.Wakana S.Wakana, M.Kishi M.Kishi, M.Tsuchiya M.Tsuchiya, Toshio Sudo

研究成果: Article

元の言語English
ページ(範囲)155-160
ジャーナルICEMC 2002
出版物ステータスPublished - 2002 10 15

これを引用

M.Iwanami, M. I., E.Yamazaki, E. Y., K.Nakano, K. N., T.Sudo, T. S., S.Haga, S. H., S.Hoshino, S. H., S.Wakana, S. W., M.Kishi, M. K., M.Tsuchiya, M. T., & Sudo, T. (2002). Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe, ICEMC 2002, 155-160.