Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

M.Iwanami M.Iwanami, E.Yamazaki E.Yamazaki, K.Nakano K.Nakano, T.Sudo T.Sudo, S.Haga S.Haga, S.Hoshino S.Hoshino, S.Wakana S.Wakana, M.Kishi M.Kishi, M.Tsuchiya M.Tsuchiya, Toshio Sudo

研究成果: Article

元の言語English
ページ(範囲)155-160
ジャーナルICEMC 2002
出版物ステータスPublished - 2002 10 15

これを引用

M.Iwanami, M. I., E.Yamazaki, E. Y., K.Nakano, K. N., T.Sudo, T. S., S.Haga, S. H., S.Hoshino, S. H., ... Sudo, T. (2002). Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe, ICEMC 2002, 155-160.

Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe, / M.Iwanami, M.Iwanami; E.Yamazaki, E.Yamazaki; K.Nakano, K.Nakano; T.Sudo, T.Sudo; S.Haga, S.Haga; S.Hoshino, S.Hoshino; S.Wakana, S.Wakana; M.Kishi, M.Kishi; M.Tsuchiya, M.Tsuchiya; Sudo, Toshio.

:: ICEMC 2002, 15.10.2002, p. 155-160.

研究成果: Article

M.Iwanami, MI, E.Yamazaki, EY, K.Nakano, KN, T.Sudo, TS, S.Haga, SH, S.Hoshino, SH, S.Wakana, SW, M.Kishi, MK, M.Tsuchiya, MT & Sudo, T 2002, 'Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,', ICEMC 2002, pp. 155-160.
M.Iwanami MI, E.Yamazaki EY, K.Nakano KN, T.Sudo TS, S.Haga SH, S.Hoshino SH その他. Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe, ICEMC 2002. 2002 10 15;155-160.
M.Iwanami, M.Iwanami ; E.Yamazaki, E.Yamazaki ; K.Nakano, K.Nakano ; T.Sudo, T.Sudo ; S.Haga, S.Haga ; S.Hoshino, S.Hoshino ; S.Wakana, S.Wakana ; M.Kishi, M.Kishi ; M.Tsuchiya, M.Tsuchiya ; Sudo, Toshio. / Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,. :: ICEMC 2002. 2002 ; pp. 155-160.
@article{d5bb1e3642774f99bbb5a4050e259716,
title = "Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,",
author = "M.Iwanami M.Iwanami and E.Yamazaki E.Yamazaki and K.Nakano K.Nakano and T.Sudo T.Sudo and S.Haga S.Haga and S.Hoshino S.Hoshino and S.Wakana S.Wakana and M.Kishi M.Kishi and M.Tsuchiya M.Tsuchiya and Toshio Sudo",
year = "2002",
month = "10",
day = "15",
language = "English",
pages = "155--160",
journal = "ICEMC 2002",

}

TY - JOUR

T1 - Magnetic Near-field Distribution Measurement over LSI Package Pins by Magneto-Optic Probe,

AU - M.Iwanami, M.Iwanami

AU - E.Yamazaki, E.Yamazaki

AU - K.Nakano, K.Nakano

AU - T.Sudo, T.Sudo

AU - S.Haga, S.Haga

AU - S.Hoshino, S.Hoshino

AU - S.Wakana, S.Wakana

AU - M.Kishi, M.Kishi

AU - M.Tsuchiya, M.Tsuchiya

AU - Sudo, Toshio

PY - 2002/10/15

Y1 - 2002/10/15

M3 - Article

SP - 155

EP - 160

JO - ICEMC 2002

JF - ICEMC 2002

ER -