Mapping of phase distribution in electron holography with a stage-scanning system

Dan Lei, K. Mitsuishi, K. Harada, M. Shimojo, Dongying Ju, M. Takeguchi

研究成果: Conference contribution

抜粋

A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

元の言語English
ホスト出版物のタイトルAdvanced Materials Science and Technology
ページ152-155
ページ数4
DOI
出版物ステータスPublished - 2013 4 10
イベント8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan
継続期間: 2012 8 12012 8 4

出版物シリーズ

名前Materials Science Forum
750
ISSN(印刷物)0255-5476

Conference

Conference8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
Japan
Fukuoka City
期間12/8/112/8/4

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • これを引用

    Lei, D., Mitsuishi, K., Harada, K., Shimojo, M., Ju, D., & Takeguchi, M. (2013). Mapping of phase distribution in electron holography with a stage-scanning system. : Advanced Materials Science and Technology (pp. 152-155). (Materials Science Forum; 巻数 750). https://doi.org/10.4028/www.scientific.net/MSF.750.152