Mapping of phase distribution in electron holography with a stage-scanning system

Dan Lei, K. Mitsuishi, K. Harada, Masayuki Shimojo, Dongying Ju, M. Takeguchi

研究成果: Conference contribution

抄録

A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

元の言語English
ホスト出版物のタイトルMaterials Science Forum
ページ152-155
ページ数4
750
DOI
出版物ステータスPublished - 2013
イベント8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City
継続期間: 2012 8 12012 8 4

出版物シリーズ

名前Materials Science Forum
750
ISSN(印刷物)02555476

Other

Other8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
Fukuoka City
期間12/8/112/8/4

Fingerprint

Electron holography
Holograms
holography
Electron optics
Scanning
scanning
electrons
electron optics
Fourier transformation
interferometry
apertures
configurations

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

これを引用

Lei, D., Mitsuishi, K., Harada, K., Shimojo, M., Ju, D., & Takeguchi, M. (2013). Mapping of phase distribution in electron holography with a stage-scanning system. : Materials Science Forum (巻 750, pp. 152-155). (Materials Science Forum; 巻数 750). https://doi.org/10.4028/www.scientific.net/MSF.750.152

Mapping of phase distribution in electron holography with a stage-scanning system. / Lei, Dan; Mitsuishi, K.; Harada, K.; Shimojo, Masayuki; Ju, Dongying; Takeguchi, M.

Materials Science Forum. 巻 750 2013. p. 152-155 (Materials Science Forum; 巻 750).

研究成果: Conference contribution

Lei, D, Mitsuishi, K, Harada, K, Shimojo, M, Ju, D & Takeguchi, M 2013, Mapping of phase distribution in electron holography with a stage-scanning system. : Materials Science Forum. 巻. 750, Materials Science Forum, 巻. 750, pp. 152-155, 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012, Fukuoka City, 12/8/1. https://doi.org/10.4028/www.scientific.net/MSF.750.152
Lei D, Mitsuishi K, Harada K, Shimojo M, Ju D, Takeguchi M. Mapping of phase distribution in electron holography with a stage-scanning system. : Materials Science Forum. 巻 750. 2013. p. 152-155. (Materials Science Forum). https://doi.org/10.4028/www.scientific.net/MSF.750.152
Lei, Dan ; Mitsuishi, K. ; Harada, K. ; Shimojo, Masayuki ; Ju, Dongying ; Takeguchi, M. / Mapping of phase distribution in electron holography with a stage-scanning system. Materials Science Forum. 巻 750 2013. pp. 152-155 (Materials Science Forum).
@inproceedings{a57a4d40ffe04b199bc59fe261b4a338,
title = "Mapping of phase distribution in electron holography with a stage-scanning system",
abstract = "A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.",
keywords = "Electron holography, Phase distribution, Stage scan",
author = "Dan Lei and K. Mitsuishi and K. Harada and Masayuki Shimojo and Dongying Ju and M. Takeguchi",
year = "2013",
doi = "10.4028/www.scientific.net/MSF.750.152",
language = "English",
isbn = "9783037856604",
volume = "750",
series = "Materials Science Forum",
pages = "152--155",
booktitle = "Materials Science Forum",

}

TY - GEN

T1 - Mapping of phase distribution in electron holography with a stage-scanning system

AU - Lei, Dan

AU - Mitsuishi, K.

AU - Harada, K.

AU - Shimojo, Masayuki

AU - Ju, Dongying

AU - Takeguchi, M.

PY - 2013

Y1 - 2013

N2 - A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

AB - A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

KW - Electron holography

KW - Phase distribution

KW - Stage scan

UR - http://www.scopus.com/inward/record.url?scp=84875818490&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875818490&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/MSF.750.152

DO - 10.4028/www.scientific.net/MSF.750.152

M3 - Conference contribution

AN - SCOPUS:84875818490

SN - 9783037856604

VL - 750

T3 - Materials Science Forum

SP - 152

EP - 155

BT - Materials Science Forum

ER -