Mapping of phase distribution in electron holography with a stage-scanning system

Dan Lei, K. Mitsuishi, K. Harada, M. Shimojo, Dongying Ju, M. Takeguchi

研究成果: Conference contribution

抄録

A new method is proposed for mapping of phase distribution in electron holography. A stage-scanning system was used for moving the specimen to obtain a series of holograms with different specimen positions in a fixed electron-optics configuration. By applying a digital aperture that selects an area on holograms with different specimen positions, an interferogram of the specimen can be obtained directly without a complex reconstruction method such as the one using Fourier transformation. Experimental results for a Co particle demonstrated the practicability of this method.

本文言語English
ホスト出版物のタイトルAdvanced Materials Science and Technology
出版社Trans Tech Publications Ltd
ページ152-155
ページ数4
ISBN(印刷版)9783037856604
DOI
出版ステータスPublished - 2013
イベント8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan
継続期間: 2012 8 12012 8 4

出版物シリーズ

名前Materials Science Forum
750
ISSN(印刷版)0255-5476
ISSN(電子版)1662-9752

Conference

Conference8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
国/地域Japan
CityFukuoka City
Period12/8/112/8/4

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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